TN72206: Configuring the Dionex Modular HPIC System with an Inline Water Purifier and Inline Calibration for Trace Anion Determinations in Ultrapure Water: EWP Water Blank
DescriptionIn the electronics industry, ionic contamination in the range of parts per trillion (ppt, ng/L) to parts per billion (ppb) concentrations is a major concern, causing corrosion-related failures in production and final product. Ionic contamination is increasingly important as the devices decrease to size. This technical note demonstrates automated calibration and water purification on an ICS-5000+ HPIC dual IC system to minimize the system and environmental contamination which resulted in increased sensitivity to double-digit-ppt concentrations. An ICS-6000 can be used for this application.
|Keywords:||Electrolytic water purifier, Formate, Reagent Free Ion Chromatography, Reagent Free Ion Chromatography (RFIC), HPIC, ICS-5000+ HPIC system, AS-HV autosampler, fluoride, RFIC, trace anions, IC, Chloride, Sulfate, Reagent Free IC, AutoPrep, EWP, ICS-5000+ IC system, RFIC System, RFC 10, IonPac AS17-C column, IonPac AS17C column, ICS-6000, TN 73892, TN73892, TN177|
|Matrix:||Deionized water purified inline by EWP|
|Author:||Terri Christison, Daniel Khor, and Jeff Rohrer|
|Affiliation:||Thermo Fisher Scientific|