TN72206: Configuring the Dionex Modular HPIC System with an Inline Water Purifier and Inline Calibration for Trace Anion Determinations in Ultrapure Water: EWP Water Blank

Instrument Type: IC

In the electronics industry, ionic contamination in the range of parts per trillion (ppt, ng/L) to parts per billion (ppb) concentrations is a major concern, causing corrosion-related failures in production and final product. Ionic contamination is increasingly important as the devices decrease to size. This technical note demonstrates automated calibration and water purification on an ICS-5000+ HPIC dual IC system to minimize the system and environmental contamination which resulted in increased sensitivity to double-digit-ppt concentrations. An ICS-6000 can be used for this application.