Trace anions determinations in caustic solutions require high dilution to minimize column overload by the caustic sample. However, the high dilutions required prevent analysis of trace anionic contaminants. Here a single pass approach to neutralize the base sample is demonstrated using both suppressors run in recycle mode. The run time was reduced from 45 min in the previous version of this application, AN 93 using “Park and AutoNeutralize” to 12 min. This application is demonstrated on a 5% (w/w) sodium hydroxide sample. An ICS-6000 can be used for this application.

To demonstrate that oxyhalides and bromide can be successfully determined at concentrations required for regulatory standards and guidelines using a Thermo Scientific™ Dionex™ ion chromatography system equipped with a Thermo Scientific™ Dionex™ IonPac™ AS23-4μm column,Thermo Scientific™ Dionex™ CRD 300 Carbonate Removal Device, and a Thermo Scientific™ Dionex™ AERS™ 500 Carbonate Anion Electrolytically Regenerated Suppressor.

Ion chromatography (IC) has become an important technique for the evaluation of ionic cleanliness. This application note describes an IC method using a Thermo Scientific™ Dionex™ IonPac™ AS11-HC-4μm column and a Thermo Scientific™ Dionex™ ICS-5000+ HPIC system to determine extractable anionic contaminants on the surface of PCBs, including inorganic anions and weak organic acids (WOAs) following the extraction procedure described in IPC-TM-650 Method 2.3.28. An ICS-6000 can be used for this application. The addendum shows alternative methods with their benefits and limitations.

In the electronics industry, ionic contamination in the range of parts per trillion (ppt, ng/L) to parts per billion (ppb) concentrations is a major concern, causing corrosion-related failures in production and final product. Ionic contamination is increasingly important as the devices decrease to size. This technical note demonstrates automated calibration and water purification on an ICS-5000+ HPIC dual IC system to minimize the system and environmental contamination which resulted in increased sensitivity to double-digit-ppt concentrations. An ICS-6000 can be used for this application.

In the electronics industry, ionic contamination, in the range of parts per trillion (ppt, ng/L) to parts per billion (ppb) concentrations, is a major concern causing corrosion-related failures in production and as a product. Ionic contamination is increasingly important as the devices decrease to size. This technical note demonstrates automated calibration and water purification on an ICS-5000+ HPIC dual IC system to minimize the system and environmental contamination which resulted in increased sensitivity to double-digit-ppt concentrations. An ICS-6000 can be used for this application.