TN72206: Configuring the Dionex Modular HPIC System with an Inline Water Purifier and Inline Calibration for Trace Anion Determinations in Ultrapure Water: 50 ppt Standard
DescriptionIn the electronics industry, ionic contamination, in the range of parts per trillion (ppt, ng/L) to parts per billion (ppb) concentrations, is a major concern causing corrosion-related failures in production and as a product. Ionic contamination is increasingly important as the devices decrease to size. This technical note demonstrates automated calibration and water purification on an ICS-5000+ HPIC dual IC system to minimize the system and environmental contamination which resulted in increased sensitivity to double-digit-ppt concentrations. An ICS-6000 can be used for this application.
|Keywords:||Electrolytic water purifier, ICS-5000+, Reagent Free Ion Chromatography (RFIC), fluoride, Nitrate, RFIC, trace anions, IC, Nitrite, Chloride, Oxalate, phosphate, Sulfate, Reagent Free IC, Bromide, AutoPrep, RFIC System, IonPac AS17-C column, IonPac AS17C column, RFC 10 module, Reagent Free Controller, EWP module, Dionex ICS-5000+ HPIC system, ICS-6000, TN 73892, TN73892, TN177|
|Matrix:||50 ppt standard in deionized water|
|Author:||Terri Christison, Daniel Khor, and Jeff Rohrer|
|Affiliation:||Thermo Fisher Scientific, Sunnyvale, CA USA|