AN153: Monitoring for Trace Anion Contamination in the Extracts of Electronic Components.

Instrument Type: IC

This application note focuses on the determination of ionic contamination of disk drive components. A comprehensive anion analysis of drive components prior to manufacturing can significantly reduce the incidence of corrosion and head-to-disk interface failures. The anions most routinely monitored are fluoride, chloride, bromide, nitrate, sulfate, and phosphate. High-volume direct injection and preconcentration are the two methods used to increase IC sensitivity. This note describes the use of these approaches to determine trace anion contaminants in extracts of disk drive components.