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Robust analysis of REE in electronic waste - High sample throughput with analysis times of less than 2 minutes per sample with the iCAP PRO Series ICP-OES
Disassembled components of mobile phones that were selected for analysis: TFT screens, magnets from within speakers, and PCBs
Clean interference free spectrum of REE- Nd at 406.109 nm in axial viewing mode
Interference of Tb on Gd at 336.223 nm. Qtegra ISDS Software interference correction can be applied to correct for this.
Spike recoveries in spiked laboratory simulated solution run intermittently over a couple of hours
Spike recoveries in speaker magnet samples, 1 ppm spike
Recoveries of analytes, displaying instrument stability over long-term experiments (~6 hrs each, axial view) run on two days
Description
This application note describes the analysis of rare earth elements (REE), precious metals and toxic elements in electronic waste using the iCAP PRO XP Duo ICP-OES instrument. The screens, circuit boards and speaker magnets of two mobile phones were analyzed and different concentrations of REEs and other metals were found in them. Fast analysis, high sensitivity in complicated matrix, large linear dynamic range, and excellent system robustness was observed over the course of the analyses making the iCAP PRO ICP-OES the ideal choice for such applications in routine laboratories.| Market: | Environmental; Metals & Mining; Other |
| Keywords: | recycling, REE, Environment, high matrix, ICP-OES, WEEE, robust, analytical testing, Electronic waste, mobile phones, rare earth elements |
| Matrix: | Electronic waste, mobile phone thin-film transistor screen, printed circuit boards, speaker magnets |
| Author: | Sukanya Sengupta, Cristian Cojocariu, Bhagyesh Surekar |
